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I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole Cover

I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole

Measurement Science Review
Volume 18 (2018): Issue 1 (February 2018)
By: Grzegorz Tytko and  Leszek Dziczkowski  
Open Access
|Mar 2018

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DOI: https://doi.org/10.1515/msr-2018-0002 | Journal eISSN: 1335-8871
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Language: English
Page range: 7 - 12
Submitted on: Oct 25, 2017
|
Accepted on: Feb 12, 2018
|
Published on: Mar 7, 2018
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Nondestructive testing,
eddy current,
coil impedance,
calculation,
modeling,
truncated region eigenfunction expansion
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2018 Grzegorz Tytko, Leszek Dziczkowski, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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