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I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole Cover

I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole

Measurement Science Review
Volume 18 (2018): Issue 1 (February 2018)
By:  and    
Open Access
|Mar 2018
Authors

Authors

Grzegorz Tytko

grzegorz.tytko@polsl.pl

Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of Technology, Gliwice, Poland

Leszek Dziczkowski

Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of Technology, Gliwice, Poland
DOI: https://doi.org/10.1515/msr-2018-0002 | Journal eISSN: 1335-8871
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Language: English
Page range: 7 - 12
Submitted on: Oct 25, 2017
Accepted on: Feb 12, 2018
Published on: Mar 7, 2018
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Nondestructive testing,
eddy current,
coil impedance,
calculation,
modeling,
truncated region eigenfunction expansion
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2018 Grzegorz Tytko, Leszek Dziczkowski, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 18 (2018): Issue 1 (February 2018)
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