I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole Cover

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I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole

Measurement Science Review

Volume 18 (2018): Issue 1 (February 2018)

By: Grzegorz Tytko and Leszek Dziczkowski

Open Access

|Mar 2018

Authors

Grzegorz Tytko

grzegorz.tytko@polsl.pl

Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of Technology, Gliwice, Poland

Leszek Dziczkowski

Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of Technology, Gliwice, Poland

DOI: https://doi.org/10.1515/msr-2018-0002 | Journal eISSN: 1335-8871

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Language: English

Page range: 7 - 12

Submitted on: Oct 25, 2017

|

Accepted on: Feb 12, 2018

|

Published on: Mar 7, 2018

Published by: Slovak Academy of Sciences, Institute of Measurement Science

In partnership with: Paradigm Publishing Services

Publication frequency: Volume open

Keywords:

Nondestructive testing,

coil impedance,

truncated region eigenfunction expansion

Related subjects:

Electrical engineering,

Control engineering, metrology and testing

© 2018 Grzegorz Tytko, Leszek Dziczkowski, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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