Physical properties of ZnTe semiconductor thin films prepared by high vacuum resistive system Cover

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Physical properties of ZnTe semiconductor thin films prepared by high vacuum resistive system

Materials Science-Poland

Volume 36 (2018): Issue 3 (September 2018)

By: M. Abbas, N. A. Shah, K. Jehangir, M. Fareed and A. Zaidi

Open Access

|Nov 2018

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DOI: https://doi.org/10.1515/msp-2018-0036 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 364 - 369

Submitted on: Sep 28, 2016

Accepted on: Mar 22, 2018

Published on: Nov 2, 2018

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

ZnTe thin films,

heat resistive materials,

vacuum evaporation,

electrical properties,

optical and structural characterization

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2018 M. Abbas, N. A. Shah, K. Jehangir, M. Fareed, A. Zaidi, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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