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Physical properties of ZnTe semiconductor thin films prepared by high vacuum resistive system Cover

Physical properties of ZnTe semiconductor thin films prepared by high vacuum resistive system

Materials Science-Poland
Volume 36 (2018): Issue 3 (September 2018)
By: ,  ,  ,   and    
Open Access
|Nov 2018
Articles in this issue
DOI: https://doi.org/10.1515/msp-2018-0036 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 364 - 369
Submitted on: Sep 28, 2016
Accepted on: Mar 22, 2018
Published on: Nov 2, 2018
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
ZnTe thin films,
heat resistive materials,
vacuum evaporation,
electrical properties,
optical and structural characterization
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2018 M. Abbas, N. A. Shah, K. Jehangir, M. Fareed, A. Zaidi, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Volume 36 (2018): Issue 3 (September 2018)
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