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InP nanowires quality control using SEM and Raman spectroscopy Cover

InP nanowires quality control using SEM and Raman spectroscopy

Open Access
|Nov 2016

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DOI: https://doi.org/10.1515/msp-2016-0116 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 851 - 855
Submitted on: Apr 19, 2016
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Accepted on: Oct 13, 2016
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Published on: Nov 27, 2016
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2016 K. Grodecki, E. Dumiszewska, M. Romaniec, W. Strupinski, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.