InP nanowires quality control using SEM and Raman spectroscopy Cover

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InP nanowires quality control using SEM and Raman spectroscopy

Materials Science-Poland

Volume 34 (2016): Issue 4 (December 2016)

By: K. Grodecki, E. Dumiszewska, M. Romaniec and W. Strupinski

Open Access

|Nov 2016

Figures & Tables

The second method for measuring InP nanowires perpendicular to the measurement table: a) placement of the sample, b) view from the optical microscope.

SEM in-lens images of InP nanowires: (a) A - undoped, (b) B - doped with Si, (c), (d) C - doped with Te.

Raman spectra of undoped InP nanowires (blue line), InP nanowires doped with Si (red line) and Te (black line).

Histogram of the FWHM TO band for undoped InP nanowires (blue color), InP nanowires doped with Si (green color) and Te (white color).

Raman spectra for InP nanowires doped with Te. The presented spectra were chosen in such a way so as to get the highest lines below the TO band.

DOI: https://doi.org/10.1515/msp-2016-0116 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 851 - 855

Submitted on: Apr 19, 2016

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Accepted on: Oct 13, 2016

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Published on: Nov 27, 2016

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

Raman spectroscopy,

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2016 K. Grodecki, E. Dumiszewska, M. Romaniec, W. Strupinski, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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