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Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings Cover

Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings

Latvian Journal of Physics and Technical Sciences
Volume 53 (2016): Issue 2 (April 2016)
By: G. Gaigals,  M. Donerblics and  G. Dreifogels  
Open Access
|May 2016

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DOI: https://doi.org/10.1515/lpts-2016-0012 | Journal eISSN: 2255-8896 | Journal ISSN: 0868-8257
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Language: English
Page range: 38 - 47
Published on: May 20, 2016
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
deconvolution,
compressive sampling,
ℓ1 minimization,
numeric simulation,
thin film coatings
Related subjects:
Physics,
Technical and applied physics

© 2016 G. Gaigals, M. Donerblics, G. Dreifogels, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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