Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings

G. Gaigals; M. Donerblics; G. Dreifogels

doi:10.1515/lpts-2016-0012

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Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings

Latvian Journal of Physics and Technical Sciences

Volume 53 (2016): Issue 2 (April 2016)

By: G. Gaigals, M. Donerblics and G. Dreifogels

Open Access

|May 2016

Abstract

The focus of the present research is to investigate possibilities of volumetric defect detection in thin film coatings on glass substrates by means of high definition imaging with no complex optical systems, such as lenses, and to determine development and construction feasibility of a defectoscope employing the investigated methods. Numerical simulations were used to test the proposed methods. Three theoretical models providing various degrees of accuracy and feasibility were studied.

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Articles in this issue

DOI: https://doi.org/10.1515/lpts-2016-0012 | Journal eISSN: 2255-8896 | Journal ISSN: 0868-8257

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Language: English

Page range: 38 - 47

Published on: May 20, 2016

Published by: Institute of Physical Energetics

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

Keywords:

deconvolution,

compressive sampling,

ℓ₁ minimization,

numeric simulation,

thin film coatings

Related subjects:

Physics,

Technical and applied physics

© 2016 G. Gaigals, M. Donerblics, G. Dreifogels, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 53 (2016): Issue 2 (April 2016)