Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings
By: G. Gaigals, M. Donerblics and G. Dreifogels
References
- 1. Gonzalez, R. C., and Woods, R. E. (2008).NJ: Pearson Prentice Hall.
- 2. McClellan, J. H., Schafer, R. W., and Yoder, M. A. (2003).. NY: Pearson Prentice Hall.
- 3. Microscopy Resource Centre (2012).. Available at.
- 4. Donoho, D. L. (2006). Compressed sensing.(4), 1289–1306.
- 5. Candès, E.J., and Romberg, J. (2007). Sparsity and incoherence in compressive sampling., 969–985.
- 6. Gaigals, G., Greitans, M., and Andziulis, A. (2013). Compressive sensing: Analysis of signals in radio astronomy.,, 347–361.
- 7. Photometrics. (2010).. Available at.
- 8. Microscopy.. Available at.
- 9. National Instrument. (2012).Available at.
- 10. Russ, J. C. (2011).. UK: CRC Press.
- 11. Fornasier, M., and Rauhut, H. (2011). Compressive sensing.(pp. 187–228). NY: Springer.
DOI: https://doi.org/10.1515/lpts-2016-0012 | Journal eISSN: 2255-8896 (formerly 0868-8257) | Journal ISSN: 0868-8257
Language: English
Page range: 38 - 47
Published on: May 20, 2016
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Keywords:
Related subjects:
© 2016 G. Gaigals, M. Donerblics, G. Dreifogels, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.