Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings
By: G. Gaigals, M. Donerblics and G. Dreifogels
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Language: English
Page range: 38 - 47
Published on: May 20, 2016
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
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© 2016 G. Gaigals, M. Donerblics, G. Dreifogels, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.