Thickness and tensile stress determination of black silicon layers by spectral reflectance and Raman scattering
Králik, Martin, Jurečka, Stanislav, Pinčík, Emil
On KCN treatment effects on optical properties of Si-based bilayers
Müllerová, Jarmila, Pinčík, Emil, Králik, Martin, Holá, Michaela, Takahashi, Masao, Kobayashi, Hikaru
About complex refractive index of black Si
Pinčík, Emil, Brunner, Robert, Kobayashi, Hikaru, Mikula, Milan
Black silicon – correlation between microstructure and Raman scattering
Jurečka, Stanislav, Pinčík, Emil, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru
9th Solid State Surfaces and Interfaces, November 21-24, 2016, Piešťany Slovakia
Pinčík, Emil, Brunner, Róbert, Bačová, Silvia, Zitto, Peter
Temperature dependence of photoluminescence peaks of porous silicon structures
Brunner, Róbert, Pinčík, Emil, Kučera, Michal, Greguš, Ján, Vojtek, Pavel, Zábudlá, Zuzana
Morphology and FT IR spectra of porous silicon
Kopani, Martin, Mikula, Milan, Kosnac, Daniel, Gregus, Jan, Pincik, Emil
Optical properties of electrochemically etched N-type silicon wafers for solar cell applications
Králik, Martin, Goraus, Matej, Pinčík, Emil