Ohmic Contacts to p-GaN Using Au/Ni-Zn-O Metallization
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- FAN, Z.: Appl. Phys. Lett.(1996), 1672.
- MURAKAMI, M.: Crit. Rev. in Solid State and Mater. Sci.(1998), 1.
- YOUN, D. H.: Jpn. J. Appl. Phys. Part 1,(1998), 1768.
- CHEN, L. C.: Solid State Electron.(2003), 1843.
- SONG, J. O.: Semicond. Sci. Technol.(2004), 669.
- SONG J. O.: Appl. Phys. Lett.(2004), 3513.
- SONG, J. O.: Appl. Phys. Lett.(2004), 4663.
- CHAE, S. W.: J. Korean Phys. Soc.(2006), 899.
- HO, J. K.: Appl. Phys. Lett.(1999), 1275.
- HO, J. K.: J. Appl. Phys.(1999), 4491.
- KOIDE, Y.: J. Electron. Mater.(1999), 341.
- MISTELE, D.: J. Cryst. Growth(2001), 564.
- CHEN, L. C.: J. Appl. Phys.(2000), 3703.
- JANG, H. W.: J. Appl. Phys.(2003), 1748.
- EENZEL, R.: Mater. Sci. Semicond. Process.(2000), 1.
- PARK, M. R.: ETRI Journ.(2002), 349.
- NARAYAN, J.: Appl. Phys. Lett.(2002), 3978.
- WANG, S. H.: J. Appl. Phys.(2002), 3711.
- LIDAY, J.: Appl. Surf. Sci.(2007), 3174.
- LIDAY, J.: J. Electrical Engin.(2010), 374.
DOI: https://doi.org/10.2478/v10187-011-0049-4 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
Language: English
Page range: 309 - 312
Published on: Oct 24, 2011
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Keywords:
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© 2011 Jozef Liday, Peter Vogrinčič, Ivan Hotový, Helmut Sitter, Alberta Bonanni, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.