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Epitaxial Growth of GaP/InxGa1-xP (xIn ≥ 0.27) Virtual Substrate for Optoelectronic Applications Cover

Epitaxial Growth of GaP/InxGa1-xP (xIn ≥ 0.27) Virtual Substrate for Optoelectronic Applications

Open Access
|Jun 2011

Abstract

Compositionally graded epitaxial semiconductor buffer layers are prepared with the aim of using them as a virtual substrate for following growth of heterostructures with the lattice parameter different from that of the substrates available on market (GaAs, GaP, InP or InAs). In this paper we report on the preparation of the step graded InxGa1-xP buffer layers on the GaP substrate. The final InxGa1-xP composition xIn was chosen to be at least 0.27. At this composition the InxGa1-xP band-gap structure converts from the indirect to the direct one and the material of such composition is suitable for application in light emitting diode structures. Our task was to design a set of layers with graded composition (graded buffer layer) and to optimize growth parameters with the aim to prepare strain relaxed template of quality suitable for the subsequent epitaxial growth.

DOI: https://doi.org/10.2478/v10187-011-0015-1 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 93 - 98
Published on: Jun 7, 2011
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2011 Stanislav Hasenöhrl, Jozef Novák, Ivo Vávra, Ján Šoltýs, Michal Kučera, Alexander Šatka, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 62 (2011): Issue 2 (March 2011)