Have a personal or library account? Click to login
Temperature measurement using a Chx/porous silicon/Si structure encapsulated in a CO2 rich environment Cover

Temperature measurement using a Chx/porous silicon/Si structure encapsulated in a CO2 rich environment

Advances in Materials Science
Volume 10 (2010): Issue 2 (June 2010)
By: A. Chiali,  N. Ghellai,  N. Gabouze and  N. Sari  
Open Access
|Aug 2010

Metrics

DOI: https://doi.org/10.2478/v10077-010-0005-1 | Journal eISSN: 2083-4799 | Journal ISSN: 1730-2439
Journal RSS Feed
Language: English
Page range: 4 - 10
Published on: Aug 26, 2010
Published by: Gdansk University of Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
porous silicon,
temperature sensor,
carbon dioxide
Related subjects:
Materials sciences,
Functional and smart materials

© 2010 A. Chiali, N. Ghellai, N. Gabouze, N. Sari, published by Gdansk University of Technology
This work is licensed under the Creative Commons License.

Volume 10 (2010): Issue 2 (June 2010)