New Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials
Open Access
|Apr 2012References
- Workman, J., Springsteen, A. W. (1997).San Diego: Academic Press.
- Shitomi, H., Saito, I. (2009). A new absolute diffuse reflectance measurement in the near-IR region based on the modified double-sphere method., 46, S186-S190.
- Apian-Bennewitz, P. (2010). New scanning goniophotometer for extended BRTF measurements. In, Vol. 7792, 77920O-1-77920O-20.
- Kawate, E. (2008). An optical accessory for absolute reflection and transmission measurements in the wavelength region from 0.24 μm to 25 μm. In, Vol. 7065, 70650M-1-70650M-11.
- Kawate, E. (2003). Symmetry X system and method for absolute measurements of reflectance and transmittance of specular samples., 42, 5064-5072.
- Kawate, E. (2009). Diffuse reflectance and transmittance measurements using a STAR GEM optical accessory. In, 20-23 May 2009. Bratislava, Slovakia: Institute of Measurement Science SAS, 270-273.
- Lukianowicz, Cz., Karpinski, T. (2003). Scatterometry of ground surfaces., 3 (3), 21-24.
DOI: https://doi.org/10.2478/v10048-012-0012-y | Journal eISSN: 1335-8871
Language: English
Page range: 56 - 61
Published on: Apr 19, 2012
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2012 E. Kawate, M. Hain, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.