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Statistical Modeling of Low SNR Magnetic Resonance Images in Wavelet Domain Using Laplacian Prior and Two-Sided Rayleigh Noise for Visual Quality Improvement Cover

Statistical Modeling of Low SNR Magnetic Resonance Images in Wavelet Domain Using Laplacian Prior and Two-Sided Rayleigh Noise for Visual Quality Improvement

Measurement Science Review
Volume 11 (2011): Issue 4 (August 2011)
By: H. Rabbani  
Open Access
|Sep 2011
DOI: https://doi.org/10.2478/v10048-011-0023-0 | Journal eISSN: 1335-8871
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Language: English
Page range: 125 - 130
Published on: Sep 21, 2011
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Wavelet transform,
magnetic resonance images,
blind deconvolution,
maximum a posteriori estimator
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2011 H. Rabbani, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 11 (2011): Issue 4 (August 2011)