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Frequency Selection of Sine Wave for Dynamic ADC Test Cover

Frequency Selection of Sine Wave for Dynamic ADC Test

Measurement Science Review
Volume 10 (2010): Issue 6 (December 2010)
By:  and    
Open Access
|Jan 2011
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DOI: https://doi.org/10.2478/v10048-010-0035-1 | Journal eISSN: 1335-8871
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Language: English
Page range: 205 - 208
Published on: Jan 20, 2011
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
ADC testing,
sine wave testing,
frequency selection,
windowed DFT,
aliasing
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2011 M. Komárek, J. Roztočil, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 10 (2010): Issue 6 (December 2010)