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The Evaluation of Expanded Uncertainty of Measurement Results in Direct Measurements Using the LabVIEW Environment Cover

The Evaluation of Expanded Uncertainty of Measurement Results in Direct Measurements Using the LabVIEW Environment

Measurement Science Review
Volume 8 (2008): Issue 6 (December 2008)
By: P. Otomański and  A. Szlachta  
Open Access
|Dec 2008
DOI: https://doi.org/10.2478/v10048-008-0032-9 | Journal eISSN: 1335-8871
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Language: English
Page range: 147 - 150
Published on: Dec 29, 2008
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Expanded uncertainty,
coverage factor,
confidence interval,
probability distribution,
virtual instrument
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2008 P. Otomański, A. Szlachta, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 8 (2008): Issue 6 (December 2008)