References
- IEEE Std. 1241-2000 (2001). IEEE Standard for Terminology and Test Methods for Analog-Digital Converters. E-ISBN: 0-7381-2725-6.
- Arpaia, P., Daponte, P., Michaeli, L. (1999). A dynamic error model for integrating analog-to-digital converters. Measurement 25, 255-264.10.1016/S0263-2241(99)00010-X
- Ludin, H. (2003). Post-Correction of Analog-to-Digital Converters. Licentiate thesis, Royal Institute of Technology, Stockholm, TRITA-S3-SB-0324.
- Wannamaker, R. A., Lipshitz, S. P., Vanderkooy, J. A. (2000). Theory of non-subtractive dither. IEEE Transactions on Signal Processing 48, 499-516.10.1109/78.823976
- Serra, A. C., da Silva, M. F., Ramos, P. M., Martins, R. C., Michaeli, L., Šaliga, J. (2005). Combined spectral and histogram analysis for fast ADC testing. IEEE Transactions on Instrumentation and Measurement 54 (4), 1617-1623.10.1109/TIM.2005.851057