References
- Stronski, A.V., Vlcek, M., Sklenar, A., Shepeljavi, P.E., Kostyukevich, S.A., & Wagner, T. (2000). Application of As40S60-xSex layers for high efficiency grating production. J. Non-Cryst. Solids, 266-269 (2), 973-978. DOI: 10.1016/S0022-3093(00)00032-6.
- Vlcek, M., Prokop, J., Frumar, M. (1994). Positive and negative etching of As-S thin layers. Int. J. Electr. 77 (6), 969-973. Retrieved from http://www.lehigh.edu/imi/Chalcogenide_Glasses/ChG11_Ref-261_Kovalskiy_Lithography%20JM3.pdf. http://www.lehigh.edu/imi/Chalcogenide_Glasses/ChG11_Ref-261_Kovalskiy_Lithography%20JM3.pdf
- Utsugi, Y. (1993). Chemical modification for nanolithography using scanning tunneling microscopy. Nanotechnology - International Workshop on Atoms and Clusters (WAC-92); 1992 Jan 8; Atami, Japan. 1992 Oct. 161-3. Precision Engineering, 15 (3), 201-201. DOI:10.1016/0141-6359(93)90034-8.
- Tokushuku, N., Moritani, K., Yanagihara, H., Konishi, K., & Noro, Y. (1992). High C/N recording in Sb2Se3/Bi write-once disk. Jpn. J. Appl. Phys., 31, 456-460. Retrieved from http://cat.inist.fr/?aModele=afficheN&cpsidt=5266186. http://cat.inist.fr/?aModele=afficheN&cpsidt=5266186
- Barton, R., Davis, C.R., Rubin, K., & Lim, G. (1986). New phase change material for optical recording with short erase time. Appl. Phys. Lett., 48 (19), 1255-1257. http://dx.doi.org/10.1063/1.97031.
- Orava, J., Wagner, T., Krbal, M., Kohoutek, T., Vlcek, M., Benes, L., Kotulanova, E., Bezdicka, P., Klapetek, P., & Frumar, M. (2007). Selective wet-etching of amorphous/crystallized Ag-As-S and Ag-As-S-Se chalcogenide thin films. J. Phys. Chem. Solids, 68 (5-6), 1008-1013. DOI: 0.1016/j.jpcs.2007.03.056.
- Orava, J., Wagner, T., Krbal, M., Kohoutek, T., Vlcek, M., & Frumar, M. (2006). Selective wet-etching of undoped and silver photodoped amorphous thin films of chalcogenide glasses in inorganic alkaline solutions. J. Non-Cryst. Solids, 352 (9-20) 1637-1640. DOI: 10.1016/j.jnoncrysol.2005.09.041.
- Orava, J., Wagner, T., Krbal, M., Kohoutek, T., Vlcek, M., Klapetek, P., & Frumar, M. (2008). Selective dissolution of Agx(As0.33S0.67-ySey)100-x chalcogenide thin films. J. Non-Cryst. Solids, 354 (2-9), 533-539. DOI: 10.1016/j.jnoncrysol.2007.07.058.
- Orava, J., Wagner, T., Krbal, M., Kohoutek, T., Vlcek, M., & Frumar, M. (2007). Selective wet-etching and characterization of chalcogenide thin films in inorganic alkaline solutions. J. Non-Cryst. Solids, 353 (13-15), 1441-1445. DOI: 10.1016/j.jnoncrysol.2006.10.069.
- Vlcek, M., Schroeter, S., Čech, J., Wágner, T., & Glaser, T. (2003). Selective etching of chalcogenides and its application for fabrication of diffractive optical elements. J. Non-Cryst. Solids, 326-327, 515-518. DOI: 10.1016/S0022-3093(03)00463-0.
- Shiman, O., Gerbreders, V., Sledevskis, E., Bulanovs, A., & Pashkevich, V. (2011). Selective Wet-Etching of Amorphous/Crystallized Sb20Se80 Thin Films. International J. of Eng. and Applied Sci., 7 (2), 820-823. Retrieved from http://www.waset.org/journals/waset/v75/v75-147.pdf. http://www.waset.org/journals/waset/v75/v75-147.pdf
- Gerbreder, Vj., Teteris, J., Sledevskis, E., & Bulanovs, A. (2007). Photoinduced changes of optical reflectivity in As2S3-Al system. J. Optoelectron Adv. Mater., 9, 3153-3156.
- Shiman, O., Gerbreders, V., Sledevskis, E., & Bulanovs, A. (2011). Electric conductivity of Sb/Se thin film micro-scale structures. Latv. J. Phys. Tec. Sci., 48 (1), 62-68. DOI: 10.2478/v10047-011-0006-9.
- Rubish, V.M., Shtets, P.P., Rubish, V.V., Semak, D.G., & Tsizh, B.R. (2003). Optical media for information recording based on amorphous layers of Sb-Se-In system. J. Optoelectronics Adv. Mat., 5, 1193-1197.