Surface Processing of TlBr Crystals for X- and γ-ray Detectors

M. Shorohov; F. Muktepavela; J. Maniks

doi:10.2478/v10047-008-0012-8

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Surface Processing of TlBr Crystals for X- and γ-ray Detectors

Latvian Journal of Physics and Technical Sciences

Volume 45 (2008): Issue 3 (June 2008)

By: M. Shorohov, F. Muktepavela and J. Maniks

Open Access

|Aug 2008

Abstract

A procedure for surface processing of TlBr crystals to be applied as X-and ?-ray detectors has been developed, providing removal of a mechanically destroyed surface layer by deep chemical etching, allowing the surfaces of good topography and thus the detectors with high energy resolution and stability to be obtained in a repeatable way. The surface quality and structural changes in the near-surface layer are estimated by the optical microscopy and indentation hardness technique.

References

Owens, A., Bavdaz, M., Lisjutin, I., Peacock, A., Sipila, H. & Zatoloka, S. (2001). On the development of compound semiconductor thallium bromide detectors for astrophysics. Nuclear Instruments and Methods in Physics Research A, 458, 413-417.10.1016/S0168-9002(00)00886-X
Search in Google Scholar
Oliveira, B.D., Chubaci, J.F., Armelin, M.J.A. & Hamada, M.M. (2004). Purification and crystal growth of TlBr for application as a radiation detector. Cryst. Res. Technol. 39, 849-854.10.1002/crat.200310264
Search in Google Scholar
Kozlov, V., Leskela, M., Prohaska, T., Schultheis, G., Stingeder, G. & Sipila, H. (2004). TlBr crystal growth, purification and characterization. Nuclear Instruments and Methods in Physics Research A, 531, 165-173.10.1016/j.nima.2004.06.002
Search in Google Scholar
Hitomi, K., Muroi, O., Matsumoto, M., Hirabuki, R., Shoji, T., Suehiro, T. & Hiratate, Y. (2001). Recent progress in thallium bromide detectors for X- and c-ray spectroscopy. Nuclear Instruments and Methods in Physics Research A, 458, 365-369.10.1016/S0168-9002(00)00883-4
Search in Google Scholar
Hitomi, K., Onodera, T. & Shoji, T. (2007). Influence of zone purification process on TlBr crystals for radiation detector fabrication. Nuclear Instruments and Methods in Physics Research A, 579, 153-156.10.1016/j.nima.2007.04.028
Search in Google Scholar
Kozlov, V., Leskela, M. & Sipila, H. (2005). Annealing and characterisation of TlBr crystals for detector applications. Nuclear Instruments and Methods in Physics Research A, 546, 200-204.10.1016/j.nima.2005.03.025
Search in Google Scholar
Kouznetsov, M.S., Lisitsky, I.S., Zatoloka, S.I. & Gostilo, V.V. (2004). Development of the technology for growing TlBr detector crystals. Nuclear Instruments and Methods in Physics Research A, 531, 174-180.10.1016/j.nima.2004.06.003
Search in Google Scholar
Kozlov, V., Leskela, M., Vehkamaki, M. & Sipila, H. (2007). Effects of metallization on TlBr single crystals for detector applications. Nuclear Instruments and Methods in Physics Research A, 573, 212-215.10.1016/j.nima.2006.10.329
Search in Google Scholar
Hitomi, K., Shoji, T. & Niizeki, Y. (2008). A method for suppressing polarization phenomena in TlBr detectors. Nuclear Instruments and Methods in Physics Research A, 585, 102-104.10.1016/j.nima.2007.11.012
Search in Google Scholar
Oliveira, I.B, Costa, F.E., Kiyohara, P.K. & Hamada, M.M. (2005). Influence of crystalline surface quality on TlBr radiation detector performance. IEEE Transactions. Nuclear Science, 52, 2058-2062.10.1109/TNS.2005.856788
Search in Google Scholar
Kozlov, V., Leskela, M., Kemella, M. & Sipila, H. (2006). Effects of polishing and etching on TlBr single crystals. Nuclear Instruments and Methods in Physics Research A, 563, 58-61.10.1016/j.nima.2006.01.065
Search in Google Scholar
Gostilo, V., Gryaznov, D. & Lisjutin, I. (2002). Technological limitations and processing-generated defects at the development of pixel and strip arrays. Nuclear Instruments and Methods in Physics Research A, 487, 13-18.10.1016/S0168-9002(02)00938-5
Search in Google Scholar
Engel, A. (2006). Contributions to the surface preparation of semiconductor materials of low hardness. Kristall und Technik, 15, 1439-1446.10.1002/crat.19800151225
Search in Google Scholar
Manika, I. & Maniks J. (1992). Characteristics of deformation localization and limits to the microhardness testing of amorphous and polycrystalline coatings. Thin Solid Films, 208, 223-227.10.1016/0040-6090(92)90646-S
Search in Google Scholar
Kozorezov, A.G., Wigmore, J.K., Owens, A., Hartog, R., Peacock, A. & Al-Jawhari, H. A. (2005). Resolution degradation of semiconductor detectors due to carrier trapping. Nuclear Instruments and Methods in Physics Research A, 546, 209-212.10.1016/j.nima.2005.03.026
Search in Google Scholar
Hansen, H. E. & Petersen, K. (2006). Surface damage from diamond-saw cutting of high purity Mo studied by positrons. Phys. Status Solidi (a), 69, 625-629.10.1002/pssa.2210690223
Search in Google Scholar
Varchenya S.A., Simanovskis, A.A. & Stolyarova, S.V. (1988). Adhesion of thin metallic films to non-metallic substrates. Thin Solid Films, 164, 147-152.10.1016/0040-6090(88)90125-3
Search in Google Scholar
Varchenya, S.A., Simanovskis, A.A. & Stolyarova, S.V. Degradation mechanisms of the contact between metallic films and alkali halide crystals. Thin Solid Films, 192, 73-78.10.1016/0040-6090(90)90479-W
Search in Google Scholar
Gostilo, V., Owens, A., Bavdaz, M., Lisjutin, I., Peacock, A., Sipila, H. & Zatoloka, S. (2001). Single detectors and pixel arrays based on TlBr. IEEE Nuclear Science Symposium and Medical Imaging, 4, 2415-2419.
Search in Google Scholar
Zaletin, V.M. (2004). Development of semiconductor detectors based on wide-gap materials. Atomic Energy, 97, 773-780.10.1007/s10512-005-0061-5
Search in Google Scholar

Articles in this issue

DOI: https://doi.org/10.2478/v10047-008-0012-8 | Journal eISSN: 2255-8896 | Journal ISSN: 0868-8257

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Language: English

Page range: 43 - 49

Published on: Aug 14, 2008

Published by: Institute of Physical Energetics

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

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Technical and applied physics

© 2008 M. Shorohov, F. Muktepavela, J. Maniks, published by Institute of Physical Energetics
This work is licensed under the Creative Commons License.

Volume 45 (2008): Issue 3 (June 2008)