Surface Processing of TlBr Crystals for X- and γ-ray Detectors
By: M. Shorohov, F. Muktepavela and J. Maniks
Open Access
|Aug 2008References
- Owens, A., Bavdaz, M., Lisjutin, I., Peacock, A., Sipila, H. & Zatoloka, S. (2001). On the development of compound semiconductor thallium bromide detectors for astrophysics., 458, 413-417.
- Oliveira, B.D., Chubaci, J.F., Armelin, M.J.A. & Hamada, M.M. (2004). Purification and crystal growth of TlBr for application as a radiation detector.39, 849-854.
- Kozlov, V., Leskela, M., Prohaska, T., Schultheis, G., Stingeder, G. & Sipila, H. (2004). TlBr crystal growth, purification and characterization., 531, 165-173.
- Hitomi, K., Muroi, O., Matsumoto, M., Hirabuki, R., Shoji, T., Suehiro, T. & Hiratate, Y. (2001). Recent progress in thallium bromide detectors for X- and c-ray spectroscopy., 458, 365-369.
- Hitomi, K., Onodera, T. & Shoji, T. (2007). Influence of zone purification process on TlBr crystals for radiation detector fabrication., 579, 153-156.
- Kozlov, V., Leskela, M. & Sipila, H. (2005). Annealing and characterisation of TlBr crystals for detector applications., 546, 200-204.
- Kouznetsov, M.S., Lisitsky, I.S., Zatoloka, S.I. & Gostilo, V.V. (2004). Development of the technology for growing TlBr detector crystals., 531, 174-180.
- Kozlov, V., Leskela, M., Vehkamaki, M. & Sipila, H. (2007). Effects of metallization on TlBr single crystals for detector applications., 573, 212-215.
- Hitomi, K., Shoji, T. & Niizeki, Y. (2008). A method for suppressing polarization phenomena in TlBr detectors., 585, 102-104.
- Oliveira, I.B, Costa, F.E., Kiyohara, P.K. & Hamada, M.M. (2005). Influence of crystalline surface quality on TlBr radiation detector performance., 52, 2058-2062.
- Kozlov, V., Leskela, M., Kemella, M. & Sipila, H. (2006). Effects of polishing and etching on TlBr single crystals., 563, 58-61.
- Gostilo, V., Gryaznov, D. & Lisjutin, I. (2002). Technological limitations and processing-generated defects at the development of pixel and strip arrays., 487, 13-18.
- Engel, A. (2006). Contributions to the surface preparation of semiconductor materials of low hardness., 15, 1439-1446.
- Manika, I. & Maniks J. (1992). Characteristics of deformation localization and limits to the microhardness testing of amorphous and polycrystalline coatings., 208, 223-227.
- Kozorezov, A.G., Wigmore, J.K., Owens, A., Hartog, R., Peacock, A. & Al-Jawhari, H. A. (2005). Resolution degradation of semiconductor detectors due to carrier trapping., 546, 209-212.
- Hansen, H. E. & Petersen, K. (2006). Surface damage from diamond-saw cutting of high purity Mo studied by positrons.(a), 69, 625-629.
- Varchenya S.A., Simanovskis, A.A. & Stolyarova, S.V. (1988). Adhesion of thin metallic films to non-metallic substrates., 164, 147-152.
- Varchenya, S.A., Simanovskis, A.A. & Stolyarova, S.V. Degradation mechanisms of the contact between metallic films and alkali halide crystals., 192, 73-78.
- Gostilo, V., Owens, A., Bavdaz, M., Lisjutin, I., Peacock, A., Sipila, H. & Zatoloka, S. (2001). Single detectors and pixel arrays based on TlBr., 4, 2415-2419.
- Zaletin, V.M. (2004). Development of semiconductor detectors based on wide-gap materials., 97, 773-780.
DOI: https://doi.org/10.2478/v10047-008-0012-8 | Journal eISSN: 2255-8896 (formerly 0868-8257) | Journal ISSN: 0868-8257
Language: English
Page range: 43 - 49
Published on: Aug 14, 2008
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Related subjects:
© 2008 M. Shorohov, F. Muktepavela, J. Maniks, published by Institute of Physical Energetics
This work is licensed under the Creative Commons License.