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Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests Cover

Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

International Journal of Applied Mathematics and Computer Science
Volume 18 (2008): Issue 3 (September 2008)
By:   
Open Access
|Oct 2008
Articles in this issue
DOI: https://doi.org/10.2478/v10006-008-0030-y | Journal eISSN: 2083-8492 | Journal ISSN: 1641-876X
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Language: English
Page range: 329 - 339
Published on: Oct 6, 2008
Published by: University of Zielona Góra
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
random-access memory (RAM),
memory testing,
March memory test,
neighbourhood pattern sensitive faults,
memory address,
memory background,
Gray code,
Hamming distance
Related subjects:
Mathematics,
Applied mathematics

© 2008 Svetlana Yarmolik, published by University of Zielona Góra
This work is licensed under the Creative Commons License.

Volume 18 (2008): Issue 3 (September 2008)