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(Bi2Te3)0:25(Sb2Te3)0:75 crystal structure improvements with excess Te as studied by AFM, SEM, EBSD and XRD Cover

(Bi2Te3)0:25(Sb2Te3)0:75 crystal structure improvements with excess Te as studied by AFM, SEM, EBSD and XRD

Materials Science-Poland
Volume 29 (2011): Issue 2 (June 2011)
By: ,  ,   and    
Open Access
|Dec 2011
References

References

  1. [1] Ioffe A.F., Semiconductor thermoelements and thermoelectric cooling, Infosearch, London, 1957. P. 39.
    Search in Google Scholar
  2. [2] Goldsmid H.J., Electronic refrigeration, Piton, London, 1986.
    Search in Google Scholar
  3. [3] Ha H.P., Cho Y.W., Byun J.Y., Shim J.D., Proc. 12th Int. Conf. Thermoelectrics, Yokohama, Japan, 1993, p. 105.
    Search in Google Scholar
  4. [4] Ivanova L.D., Granatkina Yu.v., Polikarpova N.V., Smirnova E.I., Inorg. Mater., 33 (1997), 558.
    Search in Google Scholar
  5. [5] Zakeri M., Allahkarami M., Kavei Gh., Khanmohammadian A., Rahimipour M.R., J. Mater. Sci., 43 (2008), 1638. http://dx.doi.org/10.1007/s10853-007-2347-6
    Open DOISearch in Google Scholar
  6. [6] Zakeri M., Allahkarami M., Kavei Gh., Khanmohammadian A., Rahimipour M.R., J. Mater. Process. Tech., 209 (2009), 96. http://dx.doi.org/10.1016/j.jmatprotec.2008.01.027
    Open DOISearch in Google Scholar
  7. [7] Seo J., Park K., Lee D., LEE C., Scr. Mater., 38 (1998), 477. http://dx.doi.org/10.1016/S1359-6462(97)00463-6
    Open DOISearch in Google Scholar
  8. [8] Hyun D.B., Hwang J.S., Shim J.D., Oh T.S., J. Mater. Sci., 36 (2001), 1285. http://dx.doi.org/10.1023/A:1004862700211
    Open DOISearch in Google Scholar
  9. [9] Tritt T.M., Science, 283 (1999), 804. http://dx.doi.org/10.1126/science.283.5403.804
    Open DOISearch in Google Scholar
  10. [10] Smith M.J., Knight R.J., Spencer C.W., J. Appl. Phys., 33 (1962), 2186. http://dx.doi.org/10.1063/1.1728925
    Open DOISearch in Google Scholar
  11. [11] Oh T.S., Hyun B.D., Kolomoeets E.D., Scripta Mater., 42 (2000), 849. http://dx.doi.org/10.1016/S1359-6462(00)00302-X
    Open DOISearch in Google Scholar
  12. [12] Kavei G., Karami M.A., Bull. Mater. Sci., Vol. 29 № 7 (2006), 659.
    Search in Google Scholar
  13. [13] Jiang J., Chen L., Bai S., Yao Q., Wang Q., J. Cryst. Growth, 277 (2005), 258. http://dx.doi.org/10.1016/j.jcrysgro.2004.12.144
    Open DOISearch in Google Scholar
  14. [14] Yang J., Aizawa T., Yamamoto A., Ohta T., J. Alloy Comp., 309 (2000), 225. http://dx.doi.org/10.1016/S0925-8388(00)01063-X
    Open DOISearch in Google Scholar
  15. [15] Heon P.H., Young W.C., Ji Y.B., Jae D.S., J. Phys. Chem. Solids, 55 (1994), 1233. http://dx.doi.org/10.1016/0022-3697(94)90204-6
    Open DOISearch in Google Scholar
  16. [16] Kim H.C., Oh T.S., Hyun D.B., J. Phys. Chem. Solids, 61 (2000), 743. http://dx.doi.org/10.1016/S0022-3697(99)00269-3
    Open DOISearch in Google Scholar
  17. [17] Smirous K., Stourac L., Z. Naturforsch. A, 14 (1959), 848.
    Open DOISearch in Google Scholar
  18. [18] Rosi F.D., Hockings E.F., Lindenblad N.E., RCA Rev., 22 (1961),82.
    Search in Google Scholar
  19. [19] Xi’an Fan, Yang J., Zhu W., Bao S., Duan X., Zhang Q., J. Alloy Comp., Vol. 448 Issues 1–2 (2008), 308.
    Open DOISearch in Google Scholar
  20. [20] Scherrer H., Hammou B. And Scherrer S., Phys, Lett. A, 130 (1988), 161. http://dx.doi.org/10.1016/0375-9601(88)90421-5
    Open DOISearch in Google Scholar
  21. [21] Hsu K.F., Loo S., Guo F., Chen W., Dyck J.S., Uher C., Hogen T., Polychroniadis E.K., Kanatzidis M.G., Science, 303 (2004), 818. http://dx.doi.org/10.1126/science.1092963
    Open DOISearch in Google Scholar
  22. [22] Birdi K.S., Scanning Prob Microscopes, Applications in Science and Technology, CRC Press, Boca Raton, London, 2003. http://dx.doi.org/10.1201/9780203011072
    Open DOISearch in Google Scholar
  23. [23] Kavei G., Zare Y., Seyyedi A., Journal of Thermoelectricity, № 2 (2008), 57.
    Search in Google Scholar
  24. [24] A.V. Petrov, V.A. Kutasov, Thermoelectric properties of semiconductors (ed.) (New York: Consultants Bureau), (1964), p. 17.
    Search in Google Scholar
  25. [25] Alam M.N., Blackman M., Pashley D.W., Highangle Kikuchi Patterns, Proc. Roy. Soc., 221 (1954), 224. http://dx.doi.org/10.1098/rspa.1954.0017
    Open DOISearch in Google Scholar
  26. [26] Baba-Kishi K.Z., Dingley D.J., J. Appl. Cryst., 22 (1989), 189. http://dx.doi.org/10.1107/S0021889888013342
    Open DOISearch in Google Scholar
  27. [27] Kavei G., Karami M.A., Eur. Phys. J. Appl. Phys., 42 (2008), 67. http://dx.doi.org/10.1051/epjap:2008040
    Open DOISearch in Google Scholar
  28. [28] Uemura K., Nishida I., Thermoelectric Semiconductors and their Applications, Nikkan Kogyo Shinbun Press, Tokyo, 1988, p. 145.
    Search in Google Scholar
  29. [29] Seo J., Park K., Lee D., Lee C., Scripta Mater., 38 (1998), 477. http://dx.doi.org/10.1016/S1359-6462(97)00463-6
    Open DOISearch in Google Scholar
  30. [30] Iwaisoko Y., Aizawa T., Yamamoto A., Ohta T., Jpn. J. Powder Metall., Vol. 45 № 10 (1998), 958. http://dx.doi.org/10.2497/jjspm.45.958
    Open DOISearch in Google Scholar
DOI: https://doi.org/10.2478/s13536-011-0021-9 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
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Language: English
Page range: 143 - 151
Published on: Dec 27, 2011
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
structure homogeneity,
intrinsic structure,
Atomic Force Microscopy (AFM),
Scanning Electron Microscopy (SEM),
Electron Backscatter Diffraction (EBSD)
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2011 G. Kavei, K. Ahmadi, A. Shadmehr, A. Kavei, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 29 (2011): Issue 2 (June 2011)
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