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(Bi2Te3)0:25(Sb2Te3)0:75 crystal structure improvements with excess Te as studied by AFM, SEM, EBSD and XRD Cover

(Bi2Te3)0:25(Sb2Te3)0:75 crystal structure improvements with excess Te as studied by AFM, SEM, EBSD and XRD

Materials Science-Poland
Volume 29 (2011): Issue 2 (June 2011)
By: ,  ,   and    
Open Access
|Dec 2011
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DOI: https://doi.org/10.2478/s13536-011-0021-9 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 143 - 151
Published on: Dec 27, 2011
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
structure homogeneity,
intrinsic structure,
Atomic Force Microscopy (AFM),
Scanning Electron Microscopy (SEM),
Electron Backscatter Diffraction (EBSD)
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2011 G. Kavei, K. Ahmadi, A. Shadmehr, A. Kavei, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 29 (2011): Issue 2 (June 2011)
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