(Bi2Te3)0:25(Sb2Te3)0:75 crystal structure improvements with excess Te as studied by AFM, SEM, EBSD and XRD Cover

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(Bi2Te3)0:25(Sb2Te3)0:75 crystal structure improvements with excess Te as studied by AFM, SEM, EBSD and XRD

Materials Science-Poland

Volume 29 (2011): Issue 2 (June 2011)

By: G. Kavei, K. Ahmadi, A. Shadmehr and A. Kavei

Open Access

|Dec 2011

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DOI: https://doi.org/10.2478/s13536-011-0021-9 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 143 - 151

Published on: Dec 27, 2011

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

structure homogeneity,

intrinsic structure,

Atomic Force Microscopy (AFM),

Scanning Electron Microscopy (SEM),

Electron Backscatter Diffraction (EBSD)

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2011 G. Kavei, K. Ahmadi, A. Shadmehr, A. Kavei, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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