A New Low-Noise X-Ray Imaging Detector
By: Liping Tian, Yang Yang, Lingbin Shen, Penghui Feng, Bo Wang, Yan Xu, Jinshou Tian and Yongsheng Gou
Authors
School of Network and Communication Engineering, Jinling Institute of Technology, Nanjing, China
Yang Yang
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Lingbin Shen
School of Network and Communication Engineering, Jinling Institute of Technology, Nanjing, China
Penghui Feng
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Bo Wang
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Yan Xu
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Jinshou Tian
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Yongsheng Gou
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
DOI: https://doi.org/10.2478/msr-2026-0006 | Journal eISSN: 1335-8871
Language: English
Page range: 40 - 45
Submitted on: May 2, 2025
Accepted on: Nov 21, 2025
Published on: Jan 23, 2026
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2026 Liping Tian, Yang Yang, Lingbin Shen, Penghui Feng, Bo Wang, Yan Xu, Jinshou Tian, Yongsheng Gou, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.