Authors
School of Network and Communication Engineering, Jinling Institute of Technology, Nanjing, China
Yang Yang
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Lingbin Shen
School of Network and Communication Engineering, Jinling Institute of Technology, Nanjing, China
Penghui Feng
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Bo Wang
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Yan Xu
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Jinshou Tian
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Yongsheng Gou
State Key Laboratory of Ultrafast Optical Science and Technology, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China