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Parametric Faults Detection in Analog Circuits using Variable Ranking-based Feature Selection Method and Optimized SVM Model Cover

Parametric Faults Detection in Analog Circuits using Variable Ranking-based Feature Selection Method and Optimized SVM Model

By: G. Puvaneswari  
Open Access
|Apr 2025

References

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Language: English
Page range: 30 - 39
Submitted on: Feb 24, 2024
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Accepted on: Mar 18, 2025
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Published on: Apr 15, 2025
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open

© 2025 G. Puvaneswari, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.