Parametric Faults Detection in Analog Circuits using Variable Ranking-based Feature Selection Method and Optimized SVM Model
By: G. Puvaneswari
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DOI: https://doi.org/10.2478/msr-2025-0005 | Journal eISSN: 1335-8871
Language: English
Page range: 30 - 39
Submitted on: Feb 24, 2024
Accepted on: Mar 18, 2025
Published on: Apr 15, 2025
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2025 G. Puvaneswari, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.