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Parametric Faults Detection in Analog Circuits using Variable Ranking-based Feature Selection Method and Optimized SVM Model Cover

Parametric Faults Detection in Analog Circuits using Variable Ranking-based Feature Selection Method and Optimized SVM Model

Measurement Science Review
Volume 25 (2025): Issue 1 (February 2025)
By: G. Puvaneswari  
Open Access
|Apr 2025

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DOI: https://doi.org/10.2478/msr-2025-0005 | Journal eISSN: 1335-8871
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Language: English
Page range: 30 - 39
Submitted on: Feb 24, 2024
|
Accepted on: Mar 18, 2025
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Published on: Apr 15, 2025
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
analog circuit,
fault diagnosis,
test nodes,
support vector machine,
machine learning,
feature selection
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2025 G. Puvaneswari, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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