Authors
Richard Ravasz
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Miroslav Potočný
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Daniel Arbet
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Martin Kováč
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
David Maljar
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Lukáš Nagy
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Viera Stopjaková
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia