Automatic Detection of Chip Pin Defect in Semiconductor Assembly Using Vision Measurement
By: Shengfang Lu, Jian Zhang, Fei Hao and Liangbao Jiao
DOI: https://doi.org/10.2478/msr-2022-0029 | Journal eISSN: 1335-8871
Language: English
Page range: 231 - 240
Submitted on: Nov 25, 2021
Accepted on: May 22, 2022
Published on: Aug 5, 2022
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2022 Shengfang Lu, Jian Zhang, Fei Hao, Liangbao Jiao, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.