Authors
Liping Tian
School of network and communication engineering, Jinling Institute of Technology, Nanjing, China
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Lingbin Shen
School of network and communication engineering, Jinling Institute of Technology, Nanjing, China
Yanhua Xue
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Lin Chen
School of network and communication engineering, Jinling Institute of Technology, Nanjing, China
Lili Li
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Ping Chen
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Jinshou Tian
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Wei Zhao
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China