Authors
Xiaolei Wang
College of Electrical and Information Engineering, Zhengzhou University of Light Industry, China
Huiliang Cao
National Key Laboratory for Electronic Measurement Technology, School of Instrument and Electronics, North University of China, China
Yuzhao Jiao
College of Electrical and Information Engineering, Zhengzhou University of Light Industry, China
Taishan Lou
College of Electrical and Information Engineering, Zhengzhou University of Light Industry, China
Guoqiang Ding
College of Electrical and Information Engineering, Zhengzhou University of Light Industry, China
Hongmei Zhao
College of Electrical and Information Engineering, Zhengzhou University of Light Industry, China
Xiaomin Duan
School of Electronic Science and Engineering, University of Electronic Science and Technology of China, China