Have a personal or library account? Click to login
Novel Method of Contactless Sensing of Mechanical Quantities Cover

Novel Method of Contactless Sensing of Mechanical Quantities

Measurement Science Review
Volume 20 (2020): Issue 3 (June 2020)
By: René Harťanský,  Martin Mierka,  Mikuláš Bittera,  Jozef Hallon,  Ján Halgoš,  Jaroslav Hricko,  Robert Andok and  Michal Rafaj  
Open Access
|Jul 2020

Authors

René Harťanský

Institute of Electrical Engineering, Department of Measurement, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia

Martin Mierka

xmierka@stuba.sk

Institute of Electrical Engineering, Department of Measurement, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia

Mikuláš Bittera

Institute of Electrical Engineering, Department of Measurement, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia

Jozef Hallon

Institute of Electrical Engineering, Department of Measurement, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia

Ján Halgoš

Institute of Electrical Engineering, Department of Measurement, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia

Jaroslav Hricko

Institute of Informatics, Slovak Academy of Science, Bratislava, Slovakia

Robert Andok

Institute of Informatics, Slovak Academy of Science, Bratislava, Slovakia

Michal Rafaj

RMC ltd, Nová Dubnica, Slovakia
DOI: https://doi.org/10.2478/msr-2020-0018 | Journal eISSN: 1335-8871
Journal RSS Feed
Language: English
Page range: 150 - 156
Submitted on: Apr 25, 2020
|
Accepted on: Jul 13, 2020
|
Published on: Jul 24, 2020
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Measurement of physical quantities,
MEMS,
electromagnetic field,
reflection parameters,
S parameters
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2020 René Harťanský, Martin Mierka, Mikuláš Bittera, Jozef Hallon, Ján Halgoš, Jaroslav Hricko, Robert Andok, Michal Rafaj, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Previous articleVolume 20 (2020): Issue 3 (June 2020)