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High-resolution Three-dimensional Surface Imaging Microscope Based on Digital Fringe Projection Technique Cover

High-resolution Three-dimensional Surface Imaging Microscope Based on Digital Fringe Projection Technique

Measurement Science Review
Volume 20 (2020): Issue 3 (June 2020)
By: Cheng-Yang Liu,  Tzu-Ping Yen and  Chien-Wen Chen  
Open Access
|Jul 2020

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DOI: https://doi.org/10.2478/msr-2020-0016 | Journal eISSN: 1335-8871
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Language: English
Page range: 139 - 144
Submitted on: Feb 2, 2020
|
Accepted on: Jun 22, 2020
|
Published on: Jul 24, 2020
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Digital imaging,
fringe projection,
micro-scale measurement
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2020 Cheng-Yang Liu, Tzu-Ping Yen, Chien-Wen Chen, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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