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Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis Cover

Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis

Materials Science-Poland
Volume 38 (2020): Issue 2 (June 2020)
By: Ştefan Ţălu,  Slawomir Kulesza,  Miroslaw Bramowicz,  Shahram Solaymani,  Mihai Ţălu,  Negin Beryani Nezafat and  Sahar Rezaee  
Open Access
|Oct 2020
DOI: https://doi.org/10.2478/msp-2020-0033 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 334 - 340
Submitted on: Aug 21, 2018
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Accepted on: Apr 23, 2019
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Published on: Oct 6, 2020
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
perylene diimide derivatives,
PDI8-CN thin films,
fractal analysis,
surface micromorphology
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2020 Ştefan Ţălu, Slawomir Kulesza, Miroslaw Bramowicz, Shahram Solaymani, Mihai Ţălu, Negin Beryani Nezafat, Sahar Rezaee, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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