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Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis Cover

Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis

Open Access
|Oct 2020

Authors

Ştefan Ţălu

Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI), Romania

Slawomir Kulesza

University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences, Olsztyn, Poland

Miroslaw Bramowicz

University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences, Olsztyn, Poland

Shahram Solaymani

Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah

Mihai Ţălu

University of Craiova, Faculty of Mechanics, Department of Applied Mechanics and Civil Engineering, Romania

Negin Beryani Nezafat

negin.beryanii@gmail.com

Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah

Sahar Rezaee

Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah
DOI: https://doi.org/10.2478/msp-2020-0033 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 334 - 340
Submitted on: Aug 21, 2018
|
Accepted on: Apr 23, 2019
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Published on: Oct 6, 2020
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2020 Ştefan Ţălu, Slawomir Kulesza, Miroslaw Bramowicz, Shahram Solaymani, Mihai Ţălu, Negin Beryani Nezafat, Sahar Rezaee, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.