Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis
Authors
Ştefan Ţălu
Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI), Romania
Slawomir Kulesza
University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences, Olsztyn, Poland
Miroslaw Bramowicz
University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences, Olsztyn, Poland
Shahram Solaymani
Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah
Mihai Ţălu
University of Craiova, Faculty of Mechanics, Department of Applied Mechanics and Civil Engineering, Romania
Negin Beryani Nezafat
Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah
Sahar Rezaee
Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah
Language: English
Page range: 334 - 340
Submitted on: Aug 21, 2018
Accepted on: Apr 23, 2019
Published on: Oct 6, 2020
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Related subjects:
© 2020 Ştefan Ţălu, Slawomir Kulesza, Miroslaw Bramowicz, Shahram Solaymani, Mihai Ţălu, Negin Beryani Nezafat, Sahar Rezaee, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.