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Optimization and characterization of NiO thin films prepared via NSP technique and its P-N junction diode application Cover

Optimization and characterization of NiO thin films prepared via NSP technique and its P-N junction diode application

Open Access
|Oct 2019

Authors

Joseph Saju

sajuismyname@gmail.com

Research and Development Center, Bharathiar University, Coimbatore, India

O.N. Balasundaram

Department of Physics, PSG College of Arts and Science, Coimbatore, India
DOI: https://doi.org/10.2478/msp-2019-0049 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 338 - 346
Submitted on: Jun 5, 2017
|
Accepted on: Dec 3, 2018
|
Published on: Oct 18, 2019
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2019 Joseph Saju, O.N. Balasundaram, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.