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Optimization and characterization of NiO thin films prepared via NSP technique and its P-N junction diode application Cover

Optimization and characterization of NiO thin films prepared via NSP technique and its P-N junction diode application

Materials Science-Poland
Volume 37 (2019): Issue 3 (September 2019)
By: Joseph Saju and  O.N. Balasundaram  
Open Access
|Oct 2019
DOI: https://doi.org/10.2478/msp-2019-0049 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 338 - 346
Submitted on: Jun 5, 2017
Accepted on: Dec 3, 2018
Published on: Oct 18, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
thin films,
X-ray diffraction,
optical and electrical properties
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2019 Joseph Saju, O.N. Balasundaram, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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