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Influence of Bi on dielectric properties of GaAs1−xBix alloys Cover

Influence of Bi on dielectric properties of GaAs1−xBix alloys

Materials Science-Poland
Volume 37 (2019): Issue 2 (June 2019)
By: K. Ulutas,  S. Yakut,  D. Bozoglu,  D. Deger,  M. Arslan and  A. Erol  
Open Access
|Aug 2019

Authors

K. Ulutas

Istanbul University, Science Faculty, Physics Department, Istanbul, Turkey

S. Yakut

Istanbul University, Science Faculty, Physics Department, Istanbul, Turkey

D. Bozoglu

Istanbul University, Science Faculty, Physics Department, Istanbul, Turkey

D. Deger

deger@istanbul.edu.tr

Istanbul University, Science Faculty, Physics Department, Istanbul, Turkey

M. Arslan

Sakarya University, Faculty of Arts and Sciences, Sakarya, Turkey

A. Erol

Istanbul University, Science Faculty, Physics Department, Istanbul, Turkey
DOI: https://doi.org/10.2478/msp-2019-0025 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 244 - 248
Submitted on: Jul 21, 2018
|
Accepted on: Sep 13, 2018
|
Published on: Aug 2, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
GaAsBi,
alloys,
dielectric properties,
dielectric modulus
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2019 K. Ulutas, S. Yakut, D. Bozoglu, D. Deger, M. Arslan, A. Erol, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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