Have a personal or library account? Click to login

Influence of Bi on dielectric properties of GaAs1−xBix alloys

Open Access
|Aug 2019

Abstract

Pure GaAs and GaAs1−xBix alloys with different Bi ratios (1 %, 2.5 %, 3.5 %) fitted with silver contacts were measured with a dielectric spectroscopy device. Dielectric characterization was performed at room temperature in the frequency range of 0.1 Hz to 1 MHz. GaAs exhibits three relaxation regions corresponding to space-charge, dipolar and ionic polarizations in sequence with increasing frequency while GaAs1−xBix samples show only a broad dipolar polarization in the same frequency range. This result proves the filling of the lattice with Bi through making a new bonding reducing the influence of ionic polarization. This finding supports the previous results concerning optical properties of GaAs1−xBix, presented in the literature.

DOI: https://doi.org/10.2478/msp-2019-0025 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 244 - 248
Submitted on: Jul 21, 2018
Accepted on: Sep 13, 2018
Published on: Aug 2, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 times per year

© 2019 K. Ulutas, S. Yakut, D. Bozoglu, D. Deger, M. Arslan, A. Erol, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.