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Analysis of surface properties of Ti-Cu-Ox gradient thin films using AFM and XPS investigations Cover

Analysis of surface properties of Ti-Cu-Ox gradient thin films using AFM and XPS investigations

Open Access
|Feb 2019

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DOI: https://doi.org/10.2478/msp-2018-0100 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 761 - 768
Submitted on: Nov 9, 2018
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Accepted on: Nov 30, 2018
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Published on: Feb 1, 2019
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2019 Tomasz Kotwica, Jaroslaw Domaradzki, Damian Wojcieszak, Andrzej Sikora, Malgorzata Kot, Dieter Schmeisser, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.