Have a personal or library account? Click to login
Influence of molar concentration and temperature on structural, optical, electrical and X-ray sensing properties of chemically grown nickel-bismuth-sulfide (NixBi2−xS3) thin films Cover

Influence of molar concentration and temperature on structural, optical, electrical and X-ray sensing properties of chemically grown nickel-bismuth-sulfide (NixBi2−xS3) thin films

Open Access
|Feb 2019
DOI: https://doi.org/10.2478/msp-2018-0072 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 675 - 684
Submitted on: Nov 16, 2017
Accepted on: Jul 13, 2018
Published on: Feb 1, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2019 R. Sabarish, N. Suriyanarayanan, J.M. Kalita, M.P. Sarma, G. Wary, Vipul Kheraj, Sampat G. Deshmukh, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.