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Influence of molar concentration and temperature on structural, optical, electrical and X-ray sensing properties of chemically grown nickel-bismuth-sulfide (NixBi2−xS3) thin films Cover

Influence of molar concentration and temperature on structural, optical, electrical and X-ray sensing properties of chemically grown nickel-bismuth-sulfide (NixBi2−xS3) thin films

Materials Science-Poland
Volume 36 (2018): Issue 4 (December 2018)
By: R. Sabarish,  N. Suriyanarayanan,  J.M. Kalita,  M.P. Sarma,  G. Wary,  Vipul Kheraj and  Sampat G. Deshmukh  
Open Access
|Feb 2019

Authors

R. Sabarish

Department of Physics, Government College of Technology, Coimbatore, India

N. Suriyanarayanan

nsuri22@gmail.com

Department of Physics, Government College of Technology, Coimbatore, India

J.M. Kalita

Department of Physics, Cotton University, Guwahati, India

M.P. Sarma

Department of Physics, Cotton University, Guwahati, India

G. Wary

Department of Physics, Cotton University, Guwahati, India

Vipul Kheraj

Department of Applied Physics, Sardar Vallabhbhai National Institute of Technology, Surat, India

Sampat G. Deshmukh

Department of Applied Physics, Sardar Vallabhbhai National Institute of Technology, Surat, India
DOI: https://doi.org/10.2478/msp-2018-0072 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 675 - 684
Submitted on: Nov 16, 2017
Accepted on: Jul 13, 2018
Published on: Feb 1, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
chemical bath deposition,
X-ray,
photoluminescence,
ternary compounds,
activation energy,
sensor
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2019 R. Sabarish, N. Suriyanarayanan, J.M. Kalita, M.P. Sarma, G. Wary, Vipul Kheraj, Sampat G. Deshmukh, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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