Influence of molar concentration and temperature on structural, optical, electrical and X-ray sensing properties of chemically grown nickel-bismuth-sulfide (NixBi2−xS3) thin films
Authors
R. Sabarish
Department of Physics, Government College of Technology, Coimbatore, India
N. Suriyanarayanan
Department of Physics, Government College of Technology, Coimbatore, India
J.M. Kalita
Department of Physics, Cotton University, Guwahati, India
M.P. Sarma
Department of Physics, Cotton University, Guwahati, India
G. Wary
Department of Physics, Cotton University, Guwahati, India
Vipul Kheraj
Department of Applied Physics, Sardar Vallabhbhai National Institute of Technology, Surat, India
Sampat G. Deshmukh
Department of Applied Physics, Sardar Vallabhbhai National Institute of Technology, Surat, India
Language: English
Page range: 675 - 684
Submitted on: Nov 16, 2017
Accepted on: Jul 13, 2018
Published on: Feb 1, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Related subjects:
© 2019 R. Sabarish, N. Suriyanarayanan, J.M. Kalita, M.P. Sarma, G. Wary, Vipul Kheraj, Sampat G. Deshmukh, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.