Variable Angle and Spectral Ellipsometry Study of Porous Silicon: Internal Structure of the Layers
References
- Ali, G. G., Younus, M. H., & Karomi, I. B. (2021). An overview of the evolution of porous silicon material. Journal of Education and Science, 30(2), 42–52.
- Theiß, W. (1997). Optical properties of porous silicon. Surface Science Reports, 29, 91–192. https://doi.org/10.1016/S0167-5729(96)00012-X
- Cullis, A. G. (1997). The structural and luminescence properties of porous silicon. Journal of Applied Physics, 82, 909–965. https://doi.org/10.1063/1.366536
- Lohner, T., Wentink, D. J., Varsonyi, E., & Fried, M. (1996). Characterization of porous silicon layer structures by spectroellipsometry. In Proc. of the 2nd Japan-Central Europe Joint Workshop on Modelling of Materials and Combustion, 7–9 November 1996. Budapest, Hungary.
- Fried, M., Lohner, T., Polgar, O., Petric, P., Vazsonyi, E., Barsony, I., Piel, J. P., & Stehle, J. L. (1996). Characterization of different porous silicon structures by spectroscopic ellipsometry. Thin Solid Films, 276, 223–227. https://doi.org/10.1016/0040-6090(95)08058-9
- Pettersson, L. A. A., Hultman, L., & Arwin, H. (1998). Effective-medium models for the optical properties of porous silicon. Applied Optics, 37(19), 4130–4136. https://doi.org/1010.1364/AO.37.004130
- Petric, P., Fried, M., Vazsonyi, E., & Lohner, T. (2006). Ellipsometric characterization of nanocrystals in porous silicon. Applied Surface Science, 253(1), 200–203.
- Odarych, V. A., Dacenco, O. I., Boltovec, M. S., Rudenko, O. V., & Pasichnyj, V. O. (1998). Ellipsometric studies of porous silicon. Proceedings of SPIE, 3359, 549–564.
- Makara, V. A., Odarych, V. A., Vakulenko, O. V., & Dacenco, O. I. (1999). Ellipsometric studies of porous silicon. Thin Solid Films, 342, 230–237.
- Odarych, V. A., Poperenko, L. V., & Yurgelevych, I. V. (2020). Structure of natural film on porous silicon surface founded by ellipsometry. Molecular Crystals and Liquid Crystals, 698, 46–55. https://doi.org/1010.1080/15421406.2020.1731086
- Korotcenkov, G. (Ed.). (2016). Porous Silicon: From Formation to Application. Vol. 2: Biomedical and Sensor Applications. Boca Raton: Taylor and Francis Group.
- Lishchuk, P., Vashchuk, A., Rogalsky, S., Chepela, L., Borovyi, M., Lacroix, D., & Isaiev, M. (2023). Thermal transport properties of porous silicon filled by ionic liquid nanocomposite system. Scientific Reports, 13, 5889.
- Shevchenko, V. B., Datsenko, O. I., Kravchenko, V. M., & Makara, V. A. (2019). Effect of nucleic acids on oxidation and photoluminescence of porous silicon. Journal of Nano- and Electronic Physics, 11(3), 03005.
- Shevchenko, V. B., Dacenco, O. I., Shablykin, O. V., Osadchuk, T. V., Lyakhov, A. M., Pivovarenko, Y. V., & Makara, V. A. (2012). Estimation of the ROS in the presence of biologically active substances by porous silicon fluorescence. Ukrainian Biochemical Journal, 84(4), 74.
- J.A. Woollam Co., Inc. (n.d.). Guide to using WVASE spectroscopic ellipsometry data acquisition and analysis software. Lincoln: J.A. Woollam Co., Inc.
- Odarych, V. A. (2017). Applied photometric ellipsometry. Kyiv: Pulsary, Kyiv Univ. Publ. (in Ukrainian).
DOI: https://doi.org/10.2478/lpts-2026-0030 | Journal eISSN: 2255-8896 (formerly 0868-8257) | Journal ISSN: 0868-8257
Language: English
Page range: 89 - 101
Published on: Aug 6, 2026
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Keywords:
Related subjects:
© 2026 O. Makarenko, V. Odarych, V. Shevchenko, A. Yampolskyi, T. Veremeichyk, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.