Variable Angle and Spectral Ellipsometry Study of Porous Silicon: Internal Structure of the Layers
Authors
O. Makarenko
Taras Shevchenko National University of Kyiv, Faculty of Physics, Kyiv, Ukraine
V. Odarych
Taras Shevchenko National University of Kyiv, Faculty of Physics, Kyiv, Ukraine
V. Shevchenko
Taras Shevchenko National University of Kyiv, Faculty of Physics, Kyiv, Ukraine
A. Yampolskyi
Taras Shevchenko National University of Kyiv, Faculty of Physics, Kyiv, Ukraine
T. Veremeichyk
Taras Shevchenko National University of Kyiv, Faculty of Physics, Kyiv, Ukraine
DOI: https://doi.org/10.2478/lpts-2026-0030 | Journal eISSN: 2255-8896 (formerly 0868-8257) | Journal ISSN: 0868-8257
Language: English
Page range: 89 - 101
Published on: Aug 6, 2026
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Keywords:
Related subjects:
© 2026 O. Makarenko, V. Odarych, V. Shevchenko, A. Yampolskyi, T. Veremeichyk, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.