Variable Angle and Spectral Ellipsometry Study of Porous Silicon: Internal Structure of the Layers
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DOI: https://doi.org/10.2478/lpts-2026-0030 | Journal eISSN: 2255-8896 (formerly 0868-8257) | Journal ISSN: 0868-8257
Language: English
Page range: 89 - 101
Published on: Aug 6, 2026
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
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© 2026 O. Makarenko, V. Odarych, V. Shevchenko, A. Yampolskyi, T. Veremeichyk, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.