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Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays Cover

Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays

Open Access
|Aug 2022

Abstract

We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.

DOI: https://doi.org/10.2478/lpts-2022-0031 | Journal eISSN: 2255-8896 | Journal ISSN: 0868-8257
Language: English
Page range: 25 - 35
Published on: Aug 17, 2022
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2022 A. Ozols, G. Mozolevskis, R. Zalubovskis, M. Rutkis, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.