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Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays Cover

Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays

Open Access
|Aug 2022

Authors

A. Ozols

ainars.ozols@eurolcds.com

EuroLCDs SIA, 2 Ventspils High Technology Park, Ventspils, Latvia

G. Mozolevskis

Institute of Solid State Physics, University of Latvia, Riga, Latvia

R. Zalubovskis

Latvian Institute of Organic Synthesis, Riga, Latvia

M. Rutkis

Institute of Solid State Physics, University of Latvia, Riga, Latvia
DOI: https://doi.org/10.2478/lpts-2022-0031 | Journal eISSN: 2255-8896 | Journal ISSN: 0868-8257
Language: English
Page range: 25 - 35
Published on: Aug 17, 2022
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2022 A. Ozols, G. Mozolevskis, R. Zalubovskis, M. Rutkis, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.