Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays
By: A. Ozols, G. Mozolevskis, R. Zalubovskis and M. Rutkis
Authors
G. Mozolevskis
Institute of Solid State Physics, University of Latvia, Riga, Latvia
R. Zalubovskis
Latvian Institute of Organic Synthesis, Riga, Latvia
M. Rutkis
Institute of Solid State Physics, University of Latvia, Riga, Latvia
Language: English
Page range: 25 - 35
Published on: Aug 17, 2022
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
Related subjects:
© 2022 A. Ozols, G. Mozolevskis, R. Zalubovskis, M. Rutkis, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.