Skip to main content
Have a personal or library account? Click to login
Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors Cover

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Journal of Electrical Engineering
Volume 64 (2013): Issue 2 (March 2013)
By: ,  ,  ,   and    
Open Access
|Apr 2013
References

References

  1. [1] VAN DER PAUW, L. J. : A Method of Measuring Specific Resistivity and Hall Effect of Discs of Arbitrary Shape, Philips Research Reports, 13, 1958, 1.
    Search in Google Scholar
  2. [2] MATSUMURA, T.-SATO, Y. : A Theoretical Study on Van Der Pauw Measurement Values of Inhomogeneous Compound Semiconductor Thin Films, J. Mod. Phys. 1 (2010), 340.
    Open DOISearch in Google Scholar
  3. [3] SCHUETZE, A. P. et al : Am. J. Phys. vol 72 No. 2 (Feb 2004), 49.
    Search in Google Scholar
  4. [4] GREEN, R. : Hall Effect Measurements in Materials Character- ization, Keithley Instruments, Inc., Keithley Instruments, Inc. 2O11.
    Search in Google Scholar
  5. [5] KINDER, R. et al : Journal of Electrical Engineering 56 (2005), 268-270.
    Search in Google Scholar
  6. [6] http://four-point-probes.com/ecopia.html.
    Search in Google Scholar
  7. [7] www.ecse.rpi.edu/schubert/.../A07-Specific-contact-resistance.pdf.
    Search in Google Scholar
  8. [8] FLICKYNGEROVá, S.-NETRVALOVá, M.-ŠUTTA, P.- NOVOTNY, I.-TVAROŽEK, V.-GAšPIERIK, P.-BRUN- CKO, J. : Effects of Sputtering Power and Pressure on Proper- ties of ZnO:Ga Thin Films Prepared by Oblique-Angle Deposi- tion, Thin Solid Films 520 No. 4 (2011), 1233.
    Open DOISearch in Google Scholar
  9. [9] MARTON, M.-IŽ á K, T.-VESELÝ, M.-VOJS, M.-MI- CHALKA, M.-BRUNCKO, J. : Effect of Argon and Substrate Bias on Diamond Thin Film Surface Morphology, Vacuum. 82 (2008), 154.
    Open DOISearch in Google Scholar
  10. [10] IŽ á K, T.-VOJS, M.-VESELÝ, M.-ŠKRINIAROVá, J.- NOVOTNÝ, I.-MICHALKA, M.-REDHAMMER, R. : Elec- trical Property Dependence on Thickness and Morphology of Nanocrystalline Diamond Thin Films, Microelectronics Journal 40 (2009), 615.
    Open DOISearch in Google Scholar
  11. [11] WERNER, M.-DORSCH, O.-BAERWIND, H. U.-ERSOY, A.-OBERMEIER, E.-JOHNSTON, C. : Diamond Relat. Mater. 3 (1994), 983.
    Open DOISearch in Google Scholar
DOI: https://doi.org/10.2478/jeec-2012-0015 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
Journal RSS Feed
Language: English
Page range: 106 - 111
Published on: Apr 19, 2013
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Keywords:
H.264/AVC,
OPNET modeller,
system-in-the-loop,
video transmission,
wireless local area network
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2013 Rudolf Kinder, Miroslav Mikolášek, Daniel Donoval, Jaroslav Kováč, Marek Tlaczala, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 64 (2013): Issue 2 (March 2013)
Previous article
Next article