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Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors Cover

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Journal of Electrical Engineering
Volume 64 (2013): Issue 2 (March 2013)
By: Rudolf Kinder,  Miroslav Mikolášek,  Daniel Donoval,  Jaroslav Kováč and  Marek Tlaczala  
Open Access
|Apr 2013

References

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DOI: https://doi.org/10.2478/jeec-2012-0015 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 106 - 111
Published on: Apr 19, 2013
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
H.264/AVC,
OPNET modeller,
system-in-the-loop,
video transmission,
wireless local area network
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2013 Rudolf Kinder, Miroslav Mikolášek, Daniel Donoval, Jaroslav Kováč, Marek Tlaczala, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

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