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Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors Cover

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Journal of Electrical Engineering
Volume 64 (2013): Issue 2 (March 2013)
By: Rudolf Kinder,  Miroslav Mikolášek,  Daniel Donoval,  Jaroslav Kováč and  Marek Tlaczala  
Open Access
|Apr 2013
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DOI: https://doi.org/10.2478/jeec-2012-0015 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 106 - 111
Published on: Apr 19, 2013
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
H.264/AVC,
OPNET modeller,
system-in-the-loop,
video transmission,
wireless local area network
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2013 Rudolf Kinder, Miroslav Mikolášek, Daniel Donoval, Jaroslav Kováč, Marek Tlaczala, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 64 (2013): Issue 2 (March 2013)
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