Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors Cover

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Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Journal of Electrical Engineering

Volume 64 (2013): Issue 2 (March 2013)

By: Rudolf Kinder, Miroslav Mikolášek, Daniel Donoval, Jaroslav Kováč and Marek Tlaczala

Open Access

|Apr 2013

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DOI: https://doi.org/10.2478/jeec-2012-0015 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632

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Language: English

Page range: 106 - 111

Published on: Apr 19, 2013

Published by: Slovak University of Technology in Bratislava

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

Keywords:

OPNET modeller,

system-in-the-loop,

video transmission,

wireless local area network

Related subjects:

Introductions and overviews,

Engineering, other

© 2013 Rudolf Kinder, Miroslav Mikolášek, Daniel Donoval, Jaroslav Kováč, Marek Tlaczala, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

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